Testing

Semiconductor Logistics Corporation™ is proud to provide the following value added services:

Test services for Diode, Transistor, Zener, Power Mosfet, Triac, Rectifier, SCR, UJT, PUT, J-Fets, IGBT, Power transistors, Small signal transistors, and other discrete semiconductor devices.

Our test capabilities feature:

• Up to 25KV Blocking and Reverse Voltage Capabilities
• Up to 500A Forward Voltage with 1mV Resolution
• Up to 25KV Reverse Leakage with 1 nanoamp Resolution
• 1mV Zener Voltage resolution
• Zener Impedance @ 1KHz
• Resolution to 0.1 Nanosecond for Reverse and Forward Recovery Time
• Capacitance Testing from 1KHz to 1MHz
• IFSM Capabilities up to 10,000A
• Low Temperature and Elevated Temperature Testing
• Single Test Measure and/or High Speed Data Log
• Math Software for Delta Test Parameter Calculations
• Statistical Analysis of Test Data

We also feature:

• Kitting, Preservation Packaging, Tape & Reel
• High Temperature Reverse Bias Burn In (HTRB)
• Forward / Power Burn In (BI)
• Temperature Cycle ( ≤ -100 ºC to ≥ 200 ºC)
• Fine Leak and Gross Leak
• PIND
• Solderability
• X-ray
• Environmental ( Shock, Vibration, Acceleration )
• Other Hi-Rel testing ( SEM, RGA, PDA,)